Determination of thin film parameters from high accuracy measurements of spectral regular transmittance

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

10 Citations (Scopus)
Original languageEnglish
Title of host publicationNEWRAD2002, Gaithersburg, USA, May 20-24, 2002
Place of PublicationUSA
Pages78
Publication statusPublished - 2002
MoE publication typeA4 Article in a conference publication

Keywords

  • characterization
  • complex index of refraction
  • thickness
  • thin film

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