@article{1d01d3e42577416cabf93fffebe8a352,
title = "Determination of defect content and defect profile in semiconductor heterostructures",
keywords = "defect profile, Positron annihilation spectroscopy, semiconductor heterostructure, vacancy defect, ZnO, defect profile, Positron annihilation spectroscopy, semiconductor heterostructure, vacancy defect, ZnO, defect profile, Positron annihilation spectroscopy, semiconductor heterostructure, vacancy defect, ZnO",
author = "A. Zubiaga and J.A. Garcia and F. Plazaola and J. Zu{\~n}iga-Perez and V. Mu{\~n}oz-Sanjose",
year = "2011",
doi = "10.1088/1742-6596/265/1/012004",
language = "English",
volume = "265",
journal = "Journal of Physics: Conference Series",
issn = "1742-6588",
publisher = "Institute of Physics Publishing",
number = "1",
}