Detection of Nickel in Silicon by Recombination Lifetime Measurements

Hele Savin, Marko Yli-Koski, Antti Haarahiltunen, Heli Talvitie, Juha Sinkkonen

    Research output: Contribution to journalArticleScientificpeer-review

    3 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)183-188
    JournalECS Transactions
    Volume131
    Issue number3
    Publication statusPublished - 2007
    MoE publication typeA1 Journal article-refereed

    Keywords

    • characterization
    • nickel
    • photoconductive decay
    • silicon

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