Detection and Removal of Short-circuits on GEM-foils

M. Kalliokoski*, T. Hilden, R. Lauhakangas, P. Karppinen, T. Karppinen, R. Turpeinen, J. Heino, E. Tuominen

*Corresponding author for this work

Research output: Contribution to journalConference articleScientificpeer-review

1 Citation (Scopus)


High resolution scanning system was used to locate the areas on GEM-foils that might contain short-circuit. These areas were analyzed by threshold method for fast identification. Different methods to remove short-circuits on GEM-foils were studied. Since using the standard procedure of "burning" shorts with high current might incur additional damage to the foil, we have also studied several non-destructive methods. These methods were for example washing with high power ultrasonic, manual extirpation and by using resonance frequencies. We will show results on locating and removing the GEM-shorts from standard bi-conical 10 cm ¥ 10 cm foils.

Original languageEnglish
Pages (from-to)464-471
Number of pages8
JournalPhysics Procedia
Publication statusPublished - 1 Jan 2012
MoE publication typeA4 Article in a conference publication
EventInternational Conference on Technology and Instrumentation in Particle Physics - Chicago, United States
Duration: 9 Jun 201114 Jun 2011
Conference number: 2


  • GEM
  • optical scanning system
  • short-circuit

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