Detailed comparison of illuminance scale realizations of KRISS and TKK

Seung Nam Park, Dong Hoon Lee, Yong-Wan Kim, In-Won Lee, Erkki Ikonen, Mart Noorma, Farshid Manoocheri

Research output: Working paperProfessional

Original languageEnglish
Publication statusPublished - 2005
MoE publication typeD4 Published development or research report or study

Publication series

Name9th International Conference on New Developments and Applications in Optical Radiometry, Davos, Switzerland, 2005


  • intercomparisons
  • photometry
  • spectral responsivity

Cite this