Abstract
Demand for broadband connectivity in moving platforms on land, sea, and air has opened the mass market for low-cost mobile ground-station terminals that employ electrically steerable antennas. The antennas of these terminal units need to be tested in a production line environment. Planar near-field scanning is considered as a convenient measurement method, but the time needed for conventional scanning may be prohibitive. In this paper, the design of a multiprobe planar near-field scanner for rapid antenna testing at Ku-band is presented. A probe array is moved along a spiral path to avoid large accelerations and decelerations of the probe array, and the near-field sampling is done simultaneously with multiple of respective receivers. Thus, the data acquisition time is significantly reduced compared to the single probe or receiver measurement. A preliminary antenna test-system design for the mobile ground-station terminal antennas operating at Ku-band is presented. The numerical results for simple representative antenna models suggest good performance of the system.
Original language | English |
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Title of host publication | 45th Annual Meeting and Symposium of the Antenna Measurement Techniques Association, AMTA 2023 - Proceedings |
Publisher | IEEE |
ISBN (Electronic) | 978-1-7362351-5-7 |
DOIs | |
Publication status | Published - 2023 |
MoE publication type | A4 Conference publication |
Event | Annual Meeting and Symposium of the Antenna Measurement Techniques Association - Seattle, United States Duration: 8 Oct 2023 → 13 Oct 2023 Conference number: 45 |
Publication series
Name | AMTA proceedings |
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ISSN (Electronic) | 2474-2740 |
Conference
Conference | Annual Meeting and Symposium of the Antenna Measurement Techniques Association |
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Abbreviated title | AMTA |
Country/Territory | United States |
City | Seattle |
Period | 08/10/2023 → 13/10/2023 |
Keywords
- Antenna measurements
- Ku-band
- multi-probe
- Planar near-field measurement
- spiral scan
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Aalto Electronics-ICT
Ryynänen, J. (Manager)
Department of Electronics and NanoengineeringFacility/equipment: Facility