Design, fabrication, and high-gradient testing of an X -band, traveling-wave accelerating structure milled from copper halves

Theodoros Argyropoulos, Nuria Catalan-Lasheras, Alexej Grudiev, Gerard McMonagle, Enrique Rodriguez-Castro, Igor Syrachev, Rolf Wegner, Ben Woolley, Walter Wuensch, Hao Zha, Valery Dolgashev, Gorden Bowden, Andrew Haase, Thomas Geoffrey Lucas*, Matteo Volpi, Daniel Esperante-Pereira, Robin Rajamäki

*Corresponding author for this work

    Research output: Contribution to journalArticleScientificpeer-review

    30 Citations (Scopus)
    343 Downloads (Pure)

    Abstract

    A prototype 11.994 GHz, traveling-wave accelerating structure for the Compact Linear Collider has been built, using the novel technique of assembling the structure from milled halves. The use of milled halves has many advantages when compared to a structure made from individual disks. These include the potential for a reduction in cost, because there are fewer parts, as well as a greater freedom in choice of joining technology because there are no rf currents across the halves' joint. Here we present the rf design and fabrication of the prototype structure, followed by the results of the high-power test and post-test surface analysis. During high-power testing the structure reached an unloaded gradient of 100 MV/m at a rf breakdown rate of less than 1.5×10-5 breakdowns/pulse/m with a 200 ns pulse. This structure has been designed for the CLIC testing program but construction from halves can be advantageous in a wide variety of applications.

    Original languageEnglish
    Article number061001
    Number of pages11
    JournalPhysical Review Accelerators and Beams
    Volume21
    Issue number6
    DOIs
    Publication statusPublished - 7 Jun 2018
    MoE publication typeA1 Journal article-refereed

    Fingerprint

    Dive into the research topics of 'Design, fabrication, and high-gradient testing of an X -band, traveling-wave accelerating structure milled from copper halves'. Together they form a unique fingerprint.

    Cite this