Demonstration of electron focusing using electronic lenses in low-dimensional system

Chengyu Yan, Michael Pepper, Patrick See, Ian Farrer, David Ritchie, Jonathan Griffiths

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)
103 Downloads (Pure)

Abstract

We report an all-electric integrable electron focusing lens in n-type GaAs. It is shown that a pronounced focusing peak takes place when the focal point aligns with an on-chip detector. The intensity and full width half maximum (FWHM) of the focusing peak are associated with the collimation of injected electrons. To demonstrate the reported focusing lens can be a useful tool, we investigate the characteristic of an asymmetrically gate biased quantum point contact with the assistance of a focusing lens. A correlation between the occurrence of conductance anomaly in low conductance regime and increase in FWHM of focusing peak is observed. The correlation is likely due to the electron-electron interaction. The reported electron focusing lens is essential for a more advanced electron optics device.

Original languageEnglish
Article number2593
Number of pages7
JournalScientific Reports
Volume10
Issue number1
DOIs
Publication statusPublished - 13 Feb 2020
MoE publication typeA1 Journal article-refereed

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