Degradation characterization of induced junction photodiodes under ultraviolet irradiation
- Aarre Kilpeläinen
- , Farshid Manoocheri
- , Fredrik Edhborg
- , Stefan Källberg
- , Ozhan Koybasi
- , Eivind Bardalen
- , Lutz Werner
- , Jarle Gran
- , Erkki Ikonen
- RISE Research Institutes of Sweden AB
- SINTEF
- University of South-Eastern Norway
- Physikalisch-Technische Bundesanstalt
- Justervesenet
- VTT MIKES Metrology
Research output: Contribution to journal › Article › Scientific › peer-review
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