Defects identification in FeTiO3 using positron annihilation technique

T. P. Jili; E. Sideras-Haddad; D. Wamwangi; F. Tuomisto; L. Kilanski

Defects identification in FeTiO3 using positron annihilation technique

T. P. Jili^*, E. Sideras-Haddad, D. Wamwangi, F. Tuomisto, L. Kilanski

^*Corresponding author for this work

Department of Applied Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

Abstract

Positron lifetime measurements are conducted in metal oxide material with hexagonal structure, in the temperature range from 30 K to 500 K. The analysis of the positron lifetime spectra is best fitted to two lifetime components. The positron lifetime in a defect-free region ranges from 177 ps to 186 ps in the temperature range. The second lifetime components of localized positron range from 350 ps to 462 ps in the temperature range. The second positron lifetime components are attributed to positron trapping at vacancy complexes. A close analysis of second lifetime components coupled with the fact that annihilation ratios are greater than threshold value of 1.4 suggests a formation of vacancy clusters in the temperature range from about 250 K to 500 K.

Original language	English
Title of host publication	PROCEEDINGS OF SAIP2012: THE 57TH ANNUAL CONFERENCE OF THE SOUTH AFRICAN INSTITUTE OF PHYSICS
Editors	JJ VanRensburg
Pages	81-84
Number of pages	4
Publication status	Published - 2012
MoE publication type	A4 Article in a conference publication
Event	Annual Conference of the South African Institute of Physics - Pretoria, South Africa Duration: 9 Jul 2012 → 13 Jul 2012 Conference number: 57

Conference

Conference	Annual Conference of the South African Institute of Physics
Abbreviated title	SAIP
Country	South Africa
City	Pretoria
Period	09/07/2012 → 13/07/2012

Cite this

Jili, T. P., Sideras-Haddad, E., Wamwangi, D., Tuomisto, F., & Kilanski, L. (2012). Defects identification in FeTiO3 using positron annihilation technique. In JJ. VanRensburg (Ed.), PROCEEDINGS OF SAIP2012: THE 57TH ANNUAL CONFERENCE OF THE SOUTH AFRICAN INSTITUTE OF PHYSICS (pp. 81-84)

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title = "Defects identification in FeTiO3 using positron annihilation technique",

abstract = "Positron lifetime measurements are conducted in metal oxide material with hexagonal structure, in the temperature range from 30 K to 500 K. The analysis of the positron lifetime spectra is best fitted to two lifetime components. The positron lifetime in a defect-free region ranges from 177 ps to 186 ps in the temperature range. The second lifetime components of localized positron range from 350 ps to 462 ps in the temperature range. The second positron lifetime components are attributed to positron trapping at vacancy complexes. A close analysis of second lifetime components coupled with the fact that annihilation ratios are greater than threshold value of 1.4 suggests a formation of vacancy clusters in the temperature range from about 250 K to 500 K.",

author = "Jili, {T. P.} and E. Sideras-Haddad and D. Wamwangi and F. Tuomisto and L. Kilanski",

year = "2012",

language = "English",

pages = "81--84",

editor = "JJ VanRensburg",

booktitle = "PROCEEDINGS OF SAIP2012: THE 57TH ANNUAL CONFERENCE OF THE SOUTH AFRICAN INSTITUTE OF PHYSICS",

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Jili, TP, Sideras-Haddad, E, Wamwangi, D, Tuomisto, F & Kilanski, L 2012, Defects identification in FeTiO3 using positron annihilation technique. in JJ VanRensburg (ed.), PROCEEDINGS OF SAIP2012: THE 57TH ANNUAL CONFERENCE OF THE SOUTH AFRICAN INSTITUTE OF PHYSICS. pp. 81-84, Annual Conference of the South African Institute of Physics , Pretoria, South Africa, 09/07/2012.

Defects identification in FeTiO3 using positron annihilation technique. / Jili, T. P.; Sideras-Haddad, E.; Wamwangi, D.; Tuomisto, F.; Kilanski, L.

PROCEEDINGS OF SAIP2012: THE 57TH ANNUAL CONFERENCE OF THE SOUTH AFRICAN INSTITUTE OF PHYSICS. ed. / JJ VanRensburg. 2012. p. 81-84.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Defects identification in FeTiO3 using positron annihilation technique

AU - Jili, T. P.

AU - Sideras-Haddad, E.

AU - Wamwangi, D.

AU - Tuomisto, F.

AU - Kilanski, L.

PY - 2012

Y1 - 2012

N2 - Positron lifetime measurements are conducted in metal oxide material with hexagonal structure, in the temperature range from 30 K to 500 K. The analysis of the positron lifetime spectra is best fitted to two lifetime components. The positron lifetime in a defect-free region ranges from 177 ps to 186 ps in the temperature range. The second lifetime components of localized positron range from 350 ps to 462 ps in the temperature range. The second positron lifetime components are attributed to positron trapping at vacancy complexes. A close analysis of second lifetime components coupled with the fact that annihilation ratios are greater than threshold value of 1.4 suggests a formation of vacancy clusters in the temperature range from about 250 K to 500 K.

AB - Positron lifetime measurements are conducted in metal oxide material with hexagonal structure, in the temperature range from 30 K to 500 K. The analysis of the positron lifetime spectra is best fitted to two lifetime components. The positron lifetime in a defect-free region ranges from 177 ps to 186 ps in the temperature range. The second lifetime components of localized positron range from 350 ps to 462 ps in the temperature range. The second positron lifetime components are attributed to positron trapping at vacancy complexes. A close analysis of second lifetime components coupled with the fact that annihilation ratios are greater than threshold value of 1.4 suggests a formation of vacancy clusters in the temperature range from about 250 K to 500 K.

M3 - Conference contribution

SP - 81

EP - 84

BT - PROCEEDINGS OF SAIP2012: THE 57TH ANNUAL CONFERENCE OF THE SOUTH AFRICAN INSTITUTE OF PHYSICS

A2 - VanRensburg, JJ

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