Defects identification in FeTiO3 using positron annihilation technique

T. P. Jili*, E. Sideras-Haddad, D. Wamwangi, F. Tuomisto, L. Kilanski

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Abstract

Positron lifetime measurements are conducted in metal oxide material with hexagonal structure, in the temperature range from 30 K to 500 K. The analysis of the positron lifetime spectra is best fitted to two lifetime components. The positron lifetime in a defect-free region ranges from 177 ps to 186 ps in the temperature range. The second lifetime components of localized positron range from 350 ps to 462 ps in the temperature range. The second positron lifetime components are attributed to positron trapping at vacancy complexes. A close analysis of second lifetime components coupled with the fact that annihilation ratios are greater than threshold value of 1.4 suggests a formation of vacancy clusters in the temperature range from about 250 K to 500 K.

Original languageEnglish
Title of host publicationPROCEEDINGS OF SAIP2012: THE 57TH ANNUAL CONFERENCE OF THE SOUTH AFRICAN INSTITUTE OF PHYSICS
EditorsJJ VanRensburg
Pages81-84
Number of pages4
Publication statusPublished - 2012
MoE publication typeA4 Article in a conference publication
EventAnnual Conference of the South African Institute of Physics - Pretoria, South Africa
Duration: 9 Jul 201213 Jul 2012
Conference number: 57

Conference

ConferenceAnnual Conference of the South African Institute of Physics
Abbreviated titleSAIP
CountrySouth Africa
CityPretoria
Period09/07/201213/07/2012

Cite this

Jili, T. P., Sideras-Haddad, E., Wamwangi, D., Tuomisto, F., & Kilanski, L. (2012). Defects identification in FeTiO3 using positron annihilation technique. In JJ. VanRensburg (Ed.), PROCEEDINGS OF SAIP2012: THE 57TH ANNUAL CONFERENCE OF THE SOUTH AFRICAN INSTITUTE OF PHYSICS (pp. 81-84)