Defect identification in GaAs grown at low temperatures by positron annihilation

J. Gebauer; F. Börmer; R. Krause-Rehberg; T.E.M. Staab; W. Bauer-Kugelmann; G. Küelgel; W. Trifshäser; P. Specht; R. Lutz; E.R. Weber; M. Luysberg

Defect identification in GaAs grown at low temperatures by positron annihilation

J. Gebauer, F. Börmer, R. Krause-Rehberg, T.E.M. Staab, W. Bauer-Kugelmann, G. Küelgel, W. Trifshäser, P. Specht, R. Lutz, E.R. Weber, M. Luysberg

Department of Applied Physics

Research output: Contribution to journal › Article › Scientific › peer-review

38 Citations (Scopus)

Original language	English
Pages (from-to)	8368-8379
Journal	Journal of Applied Physics
Volume	87
Publication status	Published - 2000
MoE publication type	A1 Journal article-refereed

Cite this

@article{d4e64939363a4c379ddad74873ac56d3,

title = "Defect identification in GaAs grown at low temperatures by positron annihilation",

author = "J. Gebauer and F. B{\"o}rmer and R. Krause-Rehberg and T.E.M. Staab and W. Bauer-Kugelmann and G. K{\"u}elgel and W. Trifsh{\"a}ser and P. Specht and R. Lutz and E.R. Weber and M. Luysberg",

year = "2000",

language = "English",

volume = "87",

pages = "8368--8379",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

}

Defect identification in GaAs grown at low temperatures by positron annihilation. / Gebauer, J.; Börmer, F.; Krause-Rehberg, R.; Staab, T.E.M.; Bauer-Kugelmann, W.; Küelgel, G.; Trifshäser, W.; Specht, P.; Lutz, R.; Weber, E.R.; Luysberg, M.

In: Journal of Applied Physics, Vol. 87, 2000, p. 8368-8379.

Research output: Contribution to journal › Article › Scientific › peer-review

TY - JOUR

T1 - Defect identification in GaAs grown at low temperatures by positron annihilation

AU - Gebauer, J.

AU - Börmer, F.

AU - Krause-Rehberg, R.

AU - Staab, T.E.M.

AU - Bauer-Kugelmann, W.

AU - Küelgel, G.

AU - Trifshäser, W.

AU - Specht, P.

AU - Lutz, R.

AU - Weber, E.R.

AU - Luysberg, M.

PY - 2000

Y1 - 2000

M3 - Article

VL - 87

SP - 8368

EP - 8379

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

ER -