Defect identification in GaAs grown at low temperatures by positron annihilation

J. Gebauer, F. Börmer, R. Krause-Rehberg, T.E.M. Staab, W. Bauer-Kugelmann, G. Küelgel, W. Trifshäser, P. Specht, R. Lutz, E.R. Weber, M. Luysberg

Research output: Contribution to journalArticleScientificpeer-review

38 Citations (Scopus)
Original languageEnglish
Pages (from-to)8368-8379
JournalJournal of Applied Physics
Volume87
Publication statusPublished - 2000
MoE publication typeA1 Journal article-refereed

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