Defect characterization of ZnMgSe compounds by positron annihilation and photoluminescence techniques

F. Plazaola; K. Saarinen; L. Dobrzynski; H. Reniewicz; F. Firszt; J. Szatkowski; H. Meczynska; S. Legowski; S. Chabik

Defect characterization of ZnMgSe compounds by positron annihilation and photoluminescence techniques

F. Plazaola, K. Saarinen, L. Dobrzynski, H. Reniewicz, F. Firszt, J. Szatkowski, H. Meczynska, S. Legowski, S. Chabik

Department of Applied Physics

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Journal	Journal of Applied Physics
Volume	88
Publication status	Published - 2000
MoE publication type	A1 Journal article-refereed

Cite this

@article{c3ef9c76700a4a1fa6a90d52d482bfb2,

title = "Defect characterization of ZnMgSe compounds by positron annihilation and photoluminescence techniques",

author = "F. Plazaola and K. Saarinen and L. Dobrzynski and H. Reniewicz and F. Firszt and J. Szatkowski and H. Meczynska and S. Legowski and S. Chabik",

year = "2000",

language = "English",

volume = "88",

journal = "Journal of Applied Physics",

issn = "1089-7550",

publisher = "American Institute of Physics",

}

TY - JOUR

T1 - Defect characterization of ZnMgSe compounds by positron annihilation and photoluminescence techniques

AU - Plazaola, F.

AU - Saarinen, K.

AU - Dobrzynski, L.

AU - Reniewicz, H.

AU - Firszt, F.

AU - Szatkowski, J.

AU - Meczynska, H.

AU - Legowski, S.

AU - Chabik, S.

PY - 2000

Y1 - 2000

M3 - Article

SN - 1089-7550

VL - 88

JO - Journal of Applied Physics

JF - Journal of Applied Physics

ER -