Defect characterization in semiconductors with positron annihilation spectroscopy

Research output: Chapter in Book/Report/Conference proceedingChapterScientificpeer-review

Original languageEnglish
Title of host publicationSpringer Handbook of Crystal Growth, Defects and Characterization
EditorsK.Byrappa Eds.G.Dhanaraj
Place of PublicationNew York
PagesCh. 46
Publication statusPublished - 2010
MoE publication typeA3 Part of a book or another research book

Keywords

  • defects
  • positron annihilation
  • semiconductors

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