Defect characterization in semiconductors with positron annihilation spectroscopy

Research output: Chapter in Book/Report/Conference proceedingChapterScientificpeer-review

Original languageEnglish
Title of host publicationSpringer Handbook of Crystal Growth, Defects and Characterization
EditorsK.Byrappa Eds.G.Dhanaraj
Place of PublicationNew York
PagesCh. 46
Publication statusPublished - 2010
MoE publication typeA3 Part of a book or another research book

Keywords

  • defects
  • positron annihilation
  • semiconductors

Cite this

Tuomisto, F. (2010). Defect characterization in semiconductors with positron annihilation spectroscopy. In K. B. Eds.G.Dhanaraj (Ed.), Springer Handbook of Crystal Growth, Defects and Characterization (pp. Ch. 46). New York.