Defect analysis using 2D-ACAR: GaAs as a test case

A.A. Manuel, R. Ambigapathy, K. Saarinen, P. Hautojärvi, C. Corbel

Research output: Contribution to journalArticleScientificpeer-review

5 Citations (Scopus)
Original languageEnglish
JournalApplied Surface Science
Volume85
Publication statusPublished - 1995
MoE publication typeA1 Journal article-refereed

Keywords

  • 2D-ACAR
  • GaAs

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