Defect analysis in Lely grown 6H SiC

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Keywords

@article{738b3a4111184a2d9bdad17a14f9d5f2,

title = "Defect analysis in Lely grown 6H SiC",

keywords = "optoelectronics, semiconductors, optoelectronics, semiconductors, optoelectronics, semiconductors",

author = "M. Tuominen and E. Prieur and R. Yakimova and R. Glass and T. Tuomi and E. Janzen",

year = "1996",

language = "English",

volume = "165",

pages = "233--244",

journal = "Journal of Crystal Growth",

issn = "1873-5002",

publisher = "Elsevier",

}

TY - JOUR

T1 - Defect analysis in Lely grown 6H SiC

AU - Tuominen, M.

AU - Prieur, E.

AU - Yakimova, R.

AU - Glass, R.

AU - Tuomi, T.

AU - Janzen, E.

PY - 1996

Y1 - 1996

KW - optoelectronics

KW - semiconductors

KW - optoelectronics

KW - semiconductors

KW - optoelectronics

KW - semiconductors

M3 - Article

SN - 1873-5002

VL - 165

SP - 233

EP - 244

JO - Journal of Crystal Growth

JF - Journal of Crystal Growth

ER -