Defect analysis in Lely grown 6H SiC

M. Tuominen, E. Prieur, R. Yakimova, R. Glass, T. Tuomi, E. Janzen

    Research output: Contribution to journalArticleScientificpeer-review

    14 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)233-244
    JournalJournal of Crystal Growth
    Volume165
    Publication statusPublished - 1996
    MoE publication typeA1 Journal article-refereed

    Keywords

    • optoelectronics
    • semiconductors

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