Abstract
We discuss theoretically a setup where a time-dependent current consisting of a dc bias and two sinusoidal harmonics is driven through a sample. If the sample exhibits current-dependent shot noise, the down-converted noise power spectrum varies depending on the local-oscillator phase of the mixer. The theory of this phase-dependent noise is applied to discuss the measurement of the radio-frequency single-electron transistor. We also show that this effect can be used to measure the shot noise accurately even in nonlinear high-impedance samples.
Original language | English |
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Pages (from-to) | 5927-5929 |
Number of pages | 3 |
Journal | Journal of Applied Physics |
Volume | 96 |
Issue number | 10 |
DOIs | |
Publication status | Published - 2004 |
MoE publication type | A1 Journal article-refereed |
Keywords
- mesoscopic measurement
- shot noise