Criteria for different growth modes of thin films

J. A. Nieminen, Kimmo Kaski

Research output: Contribution to journalArticleScientificpeer-review

Abstract

The possibilities to separate different growth modes of thin filsm are discussed using results of Monte Carlo simulation. The growth mode can be recognized from the time evolution of the coverage, the mean square deviation of the coverage, the estimated number of clusters on the substrate and snapshots at different stages of growth. In addition to defining and verifying the criteria for layer-by-layer and island modes, we can identify the intermediate simultaneous multilayer growth.
Original languageEnglish
Pages (from-to)L489-L496
JournalSurface Science
Volume185
Issue number1-2
DOIs
Publication statusPublished - 1987
MoE publication typeA1 Journal article-refereed

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