Abstract
Photoluminescence and positron annihilation spectroscopy have been used to characterize and identify vacancy-type defects produced in ZnO films grown on sapphire by metal-organic chemical-vapor deposition. The photoluminescence of the samples in the near band edge region has been studied, paying particular attention to the emission at 370.5nm (3.346eV). This emission has been correlated to the concentration of Zn vacancies in the films, which has been determined by positron annihilation spectroscopy.
| Original language | English |
|---|---|
| Article number | 053516 |
| Pages (from-to) | 1-6 |
| Number of pages | 6 |
| Journal | Journal of Applied Physics |
| Volume | 99 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - 2006 |
| MoE publication type | A1 Journal article-refereed |
Keywords
- photoluminescence
- positron annihilation
- Zn vacancy
- ZnO