Controlling Penetration Depth in Projection Stereolithography by Adjusting the Operation Wavelength

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Controlling Penetration Depth in Projection Stereolithography by Adjusting the Operation Wavelength. / Lehtinen, P.; Laurila, S.; Kaivola, M.; Partanen, Jouni.

In: Key Engineering Materials, Vol. 611-612, 2014, p. 756-762.

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@article{4211057c824b4f61a3cdfe62f5fe74cb,
title = "Controlling Penetration Depth in Projection Stereolithography by Adjusting the Operation Wavelength",
keywords = "Stereolithography, Stereolithography, Stereolithography",
author = "P. Lehtinen and S. Laurila and M. Kaivola and Jouni Partanen",
year = "2014",
doi = "10.4028/www.scientific.net/KEM.611-612.756",
language = "English",
volume = "611-612",
pages = "756--762",
journal = "Key Engineering Materials",
issn = "1013-9826",
publisher = "TRANS TECH PUBLICATIONS",

}

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TY - JOUR

T1 - Controlling Penetration Depth in Projection Stereolithography by Adjusting the Operation Wavelength

AU - Lehtinen, P.

AU - Laurila, S.

AU - Kaivola, M.

AU - Partanen, Jouni

PY - 2014

Y1 - 2014

KW - Stereolithography

KW - Stereolithography

KW - Stereolithography

UR - http://dx.doi.org/10.4028/www.scientific.net/KEM.611-612.756

U2 - 10.4028/www.scientific.net/KEM.611-612.756

DO - 10.4028/www.scientific.net/KEM.611-612.756

M3 - Article

VL - 611-612

SP - 756

EP - 762

JO - Key Engineering Materials

JF - Key Engineering Materials

SN - 1013-9826

ER -

ID: 913098