Content-Based Retrieval of Surface Defect Images with MPEG-7 Descriptors

Jussi Pakkanen; J. Iivarinen

Content-Based Retrieval of Surface Defect Images with MPEG-7 Descriptors

Jussi Pakkanen, J. Iivarinen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Sixth International Conference on Quality Control by Artificial Vision, Proc. SPIE 5132, 2003
Editors	K. W. Tobin Jr., F. Meriaudeau
Pages	201-208
Publication status	Published - 2003
MoE publication type	A4 Article in a conference publication

Keywords

content-based image retrieval
MPEG-7 descriptors
self-organizing map
surface defects
surface inspection

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Cite this

@inproceedings{cf4082b8f9294232a439a50a1ddd185b,

title = "Content-Based Retrieval of Surface Defect Images with MPEG-7 Descriptors",

keywords = "content-based image retrieval, MPEG-7 descriptors, self-organizing map, surface defects, surface inspection, content-based image retrieval, MPEG-7 descriptors, self-organizing map, surface defects, surface inspection, content-based image retrieval, MPEG-7 descriptors, self-organizing map, surface defects, surface inspection",

author = "Jussi Pakkanen and J. Iivarinen",

year = "2003",

language = "English",

pages = "201--208",

editor = "{Tobin Jr.}, {K. W.} and F. Meriaudeau",

booktitle = "Sixth International Conference on Quality Control by Artificial Vision, Proc. SPIE 5132, 2003",

}

Content-Based Retrieval of Surface Defect Images with MPEG-7 Descriptors. / Pakkanen, Jussi; Iivarinen, J.
Sixth International Conference on Quality Control by Artificial Vision, Proc. SPIE 5132, 2003. ed. / K. W. Tobin Jr.; F. Meriaudeau. 2003. p. 201-208.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

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KW - surface inspection

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KW - self-organizing map

KW - surface defects

KW - surface inspection

KW - content-based image retrieval

KW - MPEG-7 descriptors

KW - self-organizing map

KW - surface defects

KW - surface inspection

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EP - 208

BT - Sixth International Conference on Quality Control by Artificial Vision, Proc. SPIE 5132, 2003

A2 - Tobin Jr., K. W.

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