Consistent algorithms for multi-label classification with macro-at-k metrics

Erik Schultheis, Wojciech Kotłowski, Marek Wydmuch, Rohit Babbar, Strom Borman, Krzysztof Dembczyński

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

3 Citations (Scopus)

Abstract

We consider the optimization of complex performance metrics in multi-label classification under the population utility framework. We mainly focus on metrics linearly decomposable into a sum of binary classification utilities applied separately to each label with an additional requirement of exactly k labels predicted for each instance. These “macro-at-k” metrics possess desired properties for extreme classification problems with long tail labels. Unfortunately, the at-k constraint couples the otherwise independent binary classification tasks, leading to a much more challenging optimization problem than standard macro-averages. We provide a statistical framework to study this problem, prove the existence and the form of the optimal classifier, and propose a statistically consistent and practical learning algorithm based on the Frank-Wolfe method. Interestingly, our main results concern even more general metrics being non-linear functions of label-wise confusion matrices. Empirical results provide evidence for the competitive performance of the proposed approach.

Original languageEnglish
Title of host publication12th International Conference on Learning Representations (ICLR 2024)
PublisherCurran Associates Inc.
ISBN (Print)978-1-7138-9865-8
Publication statusPublished - 2024
MoE publication typeA4 Conference publication
EventInternational Conference on Learning Representations - Messe Wien Exhibition and Congress Center, Vienna, Austria
Duration: 7 May 202411 May 2024
Conference number: 12
https://iclr.cc/

Conference

ConferenceInternational Conference on Learning Representations
Abbreviated titleICLR
Country/TerritoryAustria
CityVienna
Period07/05/202411/05/2024
Internet address

Fingerprint

Dive into the research topics of 'Consistent algorithms for multi-label classification with macro-at-k metrics'. Together they form a unique fingerprint.

Cite this