Computational modelling of atomic-scale defect phenomena in compound semiconductors

R.M. Nieminen, T. Mattila, S. Pöykkö

Research output: Chapter in Book/Report/Conference proceedingChapterScientificpeer-review

Original languageEnglish
Title of host publicationFrontiers in Materials Modelling and Design
Place of PublicationHeidelberg, Germany
Publication statusPublished - 1998
MoE publication typeA3 Part of a book or another research book

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