Compound semiconductor detectors for X-ray astronomy: Spectroscopic measurements and material characteristics

M. Bavdaz, S. Kraft, A. Peacock, F. Scholze, M. Wedowski, G. Ulm, S. Nenonen, M.-A. Gagliardi, T. Gagliardi, T. Tuomi, Kari T. Hjelt, M. Juvonen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationMaterials Research Society Fall Meeting, Boston, USA, December 1-5, 1997
    Pages565-572
    DOIs
    Publication statusPublished - 1997
    MoE publication typeA4 Article in a conference publication

    Keywords

    • semiconductor
    • spectroscopic measurements
    • X-ray astronomy

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