Composite two-particle sources

Michael Moskalets*, Janne Kotilahti, Pablo Burset, Christian Flindt

*Corresponding author for this work

Research output: Contribution to journalReview Articlepeer-review

7 Citations (Scopus)
72 Downloads (Pure)


Multi-particle sources constitute an interesting new paradigm following the recent development of on-demand single-electron sources. Versatile devices can be designed using several single-electron sources, possibly of different types, coupled to the same quantum circuit. However, if combined non-locally to avoid cross-talk, the resulting architecture becomes very sensitive to electronic decoherence. To circumvent this problem, we here analyse two-particle sources that operate with several single-electron (or hole) emitters attached in series to the same electronic waveguide. Using Floquet scattering theory we demonstrate how such a device can emit exactly two electrons without exciting unwanted electron-hole pairs if the driving is adiabatic. Going beyond the adiabatic regime, perfect two-electron emission can be achieved by driving two quantum dot levels across the Fermi level of the external reservoir. If a single-electron source is combined with a source of holes, the emitted particles can annihilate each other in a process which is governed by the overlap of their wave functions. Importantly, the degree of annihilation can be controlled by tuning the emission times, and the overlap can be determined by measuring the shot noise after a beam splitter. In contrast to a Hong-Ou-Mandel experiment, the wave functions overlap close to the emitters and not after propagating to the beam splitter, making the shot noise reduction less susceptible to electronic decoherence.

Original languageEnglish
Pages (from-to)647-662
Number of pages16
Issue number4
Publication statusPublished - 11 Feb 2020
MoE publication typeA2 Review article, Literature review, Systematic review


Dive into the research topics of 'Composite two-particle sources'. Together they form a unique fingerprint.

Cite this