Complex Permittivity Characterization of Low-loss Slabs Using Time-gating Technique

Bing Xue*

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

Abstract

This letter presents an innovative method for assessing the complex dielectric constants of low-loss dielectric slabs at sub-Terahertz frequencies. Differing from conventional free-space techniques, the proposed approach removes the need for precise thickness knowledge of the material under test (MUT) and reference plane calibration. Even when the MUT thickness varies in a single sample, the proposed method effectively reduces the relevant estimate uncertainty. When applying it to estimate the permittivity of thick plexiglass and nylon plates across the 140-210 GHz frequency range, it demonstrates good agreement with published papers and lower uncertainty of the estimates. The proposed method is well-suited for permittivity characterizations at terahertz frequencies, particularly in scenarios where precise rulers are lacking or MUT thickness varies in a single sample.

Original languageEnglish
JournalIEEE Transactions on Components, Packaging and Manufacturing Technology
DOIs
Publication statusE-pub ahead of print - 2025
MoE publication typeA1 Journal article-refereed

Keywords

  • Terahertz
  • free space method
  • low loss slabs
  • quasi-optical system
  • time-gating technique

Fingerprint

Dive into the research topics of 'Complex Permittivity Characterization of Low-loss Slabs Using Time-gating Technique'. Together they form a unique fingerprint.

Cite this