Comparison of illuminance responsivity and luminous flux units between HUT and Nist

Jari Hovila, Pasi Toivanen, Erkki Ikonen, Yoshi Ohno

Research output: Working paperProfessional

Original languageEnglish
Place of PublicationUSA
Publication statusPublished - 2002
MoE publication typeD4 Published development or research report or study

Publication series

NameNEWRAD2002, Gaithersburg, USA, May 20-24, 2002


  • comparison
  • photometry
  • precision measurements

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