Comparison of illuminance responsivity and luminous flux units between HUT and Nist

Jari Hovila; Pasi Toivanen; Erkki Ikonen; Yoshi Ohno

Comparison of illuminance responsivity and luminous flux units between HUT and Nist

Jari Hovila, Pasi Toivanen, Erkki Ikonen, Yoshi Ohno

Department of Signal Processing and Acoustics

Research output: Working paper › Professional

Original language	English
Place of Publication	USA
Pages	116
Publication status	Published - 2002
MoE publication type	D4 Published development or research report or study

Publication series

Name	NEWRAD2002, Gaithersburg, USA, May 20-24, 2002

Keywords

comparison
photometry
precision measurements

SFX availability

Full text

Cite this

@techreport{44765cc14ac744f5aab233ac6cd7ccad,

title = "Comparison of illuminance responsivity and luminous flux units between HUT and Nist",

keywords = "comparison, photometry, precision measurements, comparison, photometry, precision measurements, comparison, photometry, precision measurements",

author = "Jari Hovila and Pasi Toivanen and Erkki Ikonen and Yoshi Ohno",

year = "2002",

language = "English",

series = "NEWRAD2002, Gaithersburg, USA, May 20-24, 2002",

pages = "116",

type = "WorkingPaper",

}

TY - UNPB

T1 - Comparison of illuminance responsivity and luminous flux units between HUT and Nist

AU - Hovila, Jari

AU - Toivanen, Pasi

AU - Ikonen, Erkki

AU - Ohno, Yoshi

PY - 2002

Y1 - 2002

KW - comparison

KW - photometry

KW - precision measurements

KW - comparison

KW - photometry

KW - precision measurements

KW - comparison

KW - photometry

KW - precision measurements

M3 - Working paper

T3 - NEWRAD2002, Gaithersburg, USA, May 20-24, 2002

SP - 116

BT - Comparison of illuminance responsivity and luminous flux units between HUT and Nist

CY - USA

ER -