Comparison of contact and contactless CV for thin film oxide characterization

Research output: Contribution to conferencePosterScientific

Researchers

Research units

Details

Original languageEnglish
Publication statusPublished - 22 May 2017
MoE publication typeNot Eligible
EventALTECH EMRS Symposium: Analytical techniques for precise characterization of nano materials - Strasbourg, France
Duration: 22 May 201726 May 2017

Conference

ConferenceALTECH EMRS Symposium
CountryFrance
CityStrasbourg
Period22/05/201726/05/2017

    Research areas

  • thin films, contactless CV, corona oxide characterization of semiconductors

ID: 14371044