Comparative analysis of synchrotron X-ray transmission and reflection topography techniques applied to epitaxial laterally overgrown GaAs layers

Research output: Contribution to journalArticle


  • R. Rantamäki
  • T. Tuomi
  • Z.R. Zytkiewicz
  • P.J. McNally
  • A.N. Danilewsky

Research units


Original languageEnglish
Pages (from-to)277-288
JournalJournal of X-Ray Science and Technology
Issue number4
Publication statusPublished - 2000
MoE publication typeA1 Journal article-refereed

    Research areas

  • epitaxy, GaAs, synchrotron x-ray topography

ID: 4147654