Comparative analysis of synchrotron X-ray transmission and reflection topography techniques applied to epitaxial laterally overgrown GaAs layers

R. Rantamäki, T. Tuomi, Z.R. Zytkiewicz, P.J. McNally, A.N. Danilewsky

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageEnglish
    Pages (from-to)277-288
    JournalJournal of X-Ray Science and Technology
    Volume8
    Issue number4
    Publication statusPublished - 2000
    MoE publication typeA1 Journal article-refereed

    Keywords

    • epitaxy
    • GaAs
    • synchrotron x-ray topography

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