Comparative analysis of synchrotron X-ray transmission and reflection topography techniques applied to epitaxial laterally overgrown GaAs layers

R. Rantamäki, T. Tuomi, Z.R. Zytkiewicz, P.J. McNally, A.N. Danilewsky

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageEnglish
    Pages (from-to)277-288
    JournalJournal of X-Ray Science and Technology
    Issue number4
    Publication statusPublished - 2000
    MoE publication typeA1 Journal article-refereed


    • epitaxy
    • GaAs
    • synchrotron x-ray topography

    Cite this