Compact 3-D on-wafer radiation pattern measurement system for 60 GHz antennas

Sylvain Ranvier, Mikko Kyrö, Clemens Icheln, Cyril Luxey, Robert Staraj, Pertti Vainikainen

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageEnglish
    Pages (from-to)319-324
    JournalMicrowave and Optical Technology Letters
    Volume51
    Issue number2
    Publication statusPublished - 2009
    MoE publication typeA1 Journal article-refereed

    Keywords

    • antenna
    • measurement system
    • radiation pattern

    Cite this

    Ranvier, S., Kyrö, M., Icheln, C., Luxey, C., Staraj, R., & Vainikainen, P. (2009). Compact 3-D on-wafer radiation pattern measurement system for 60 GHz antennas. Microwave and Optical Technology Letters, 51(2), 319-324.