@article{43c36e7b5ac94b2c8b8b32e099a9f9aa,
title = "Compact 3-D on-wafer radiation pattern measurement system for 60 GHz antennas",
keywords = "antenna, measurement system, radiation pattern, antenna, measurement system, radiation pattern, antenna, measurement system, radiation pattern",
author = "Sylvain Ranvier and Mikko Kyr{\"o} and Clemens Icheln and Cyril Luxey and Robert Staraj and Pertti Vainikainen",
year = "2009",
language = "English",
volume = "51",
pages = "319--324",
journal = "Microwave and Optical Technology Letters",
issn = "0895-2477",
publisher = "Wiley",
number = "2",
}