Compact 3-D on-wafer radiation pattern measurement system for 60 GHz antennas

Sylvain Ranvier, Mikko Kyrö, Clemens Icheln, Cyril Luxey, Robert Staraj, Pertti Vainikainen

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageEnglish
    Pages (from-to)319-324
    JournalMicrowave and Optical Technology Letters
    Issue number2
    Publication statusPublished - 2009
    MoE publication typeA1 Journal article-refereed


    • antenna
    • measurement system
    • radiation pattern

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