@article{7d01cbf824844deab3fb9d7bf5d1bdf6,
title = "Comments on 'De-embedding PCB fixtures for package characterization'",
keywords = "calibration, de-embedding, microwave measurements, scattering parameters, S-parameters, test fixture, calibration, de-embedding, microwave measurements, scattering parameters, S-parameters, test fixture, calibration, de-embedding, microwave measurements, scattering parameters, S-parameters, test fixture",
author = "K. Silvonen",
year = "2002",
language = "English",
volume = "34",
pages = "322",
journal = "Microwave and Optical Technology Letters",
issn = "0895-2477",
publisher = "Wiley",
number = "4",
}