Comments on 'De-embedding PCB fixtures for package characterization'

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageEnglish
    Pages (from-to)322
    JournalMicrowave and Optical Technology Letters
    Volume34
    Issue number4
    Publication statusPublished - 2002
    MoE publication typeA1 Journal article-refereed

    Keywords

    • calibration
    • de-embedding
    • microwave measurements
    • scattering parameters
    • S-parameters
    • test fixture

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