Chemical state quantification of iron and chromium oxides using XPS: the effect of the background subtraction method

M. Aronniemi, J. Sainio, J. Lahtinen

Research output: Contribution to journalArticleScientificpeer-review

227 Citations (Scopus)
Original languageEnglish
Pages (from-to)108-123
JournalSurface Science
Volume578
Issue number1-3
Publication statusPublished - 2005
MoE publication typeA1 Journal article-refereed

Keywords

  • background subtraction
  • chemical state
  • chromium oxide
  • curve fitting
  • iron oxide
  • XPS

Cite this