Chemical Imaging of Patterned Inorganic Thin-Film Structures by Lateral Force Microscopy

M. Utriainen, A. Leijala, L. Niinistö, R. Matero

    Research output: Contribution to journalArticleScientificpeer-review

    10 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)2452-2458
    JournalAnalytical Chemistry
    Volume71
    Publication statusPublished - 1999
    MoE publication typeA1 Journal article-refereed

    Keywords

    • lateral force microscopy
    • thin film
    • tin dioxide

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