Chemical identification of point defects and adsorbates on a metal oxide surface by atomic force microscopy

Jeppe V. Lauritsen, Adam S. Foster, Georg H. Olesen, Mona C. Christensen, Angelika Kühnle, Stig Helveg, Jens R. Rostrup-Nielsen, Bjerne S. Clausen, Michael Reichling, Flemming Besenbacher

Research output: Contribution to journalArticleScientificpeer-review

98 Citations (Scopus)
Original languageEnglish
Pages (from-to)3436–3441
Number of pages6
JournalNanotechnology
Volume17
Issue number14
DOIs
Publication statusPublished - 2006
MoE publication typeA1 Journal article-refereed

Keywords

  • AFM
  • TiO2
  • Water

Cite this

Lauritsen, J. V., Foster, A. S., Olesen, G. H., Christensen, M. C., Kühnle, A., Helveg, S., ... Besenbacher, F. (2006). Chemical identification of point defects and adsorbates on a metal oxide surface by atomic force microscopy. Nanotechnology, 17(14), 3436–3441. https://doi.org/10.1088/0957-4484/17/14/015