Chemical Identification of Ions in Doped NaCl by Scanning Force Microscopy

Adam S. Foster; Clemens Barth; Claude R. Henry

doi:10.1103/PhysRevLett.102.256103

Chemical Identification of Ions in Doped NaCl by Scanning Force Microscopy

Adam S. Foster, Clemens Barth, Claude R. Henry

Research output: Contribution to journal › Article › Scientific › peer-review

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Abstract

A quantitative comparison between experiment and theory is presented, which shows that all ions of the Suzuki structure on (001) surfaces of Mg2+ or Cd2+ doped NaCl crystals can be identified despite the tip-surface distance, differences in impurity chemistry, and surface termination. The identification can be used to calibrate the potential of the tip’s last atom, and it is proposed to use these surfaces for better characterization of deposited nano-objects.

Original language	English
Article number	256103
Pages (from-to)	1-4
Number of pages	4
Journal	Physical Review Letters
Volume	102
Issue number	25
DOIs	https://doi.org/10.1103/PhysRevLett.102.256103
Publication status	Published - 2009
MoE publication type	A1 Journal article-refereed

Keywords

AFM

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10.1103/PhysRevLett.102.256103

PhysRevLett.102.256103Final published version, 1.28 MB

http://link.aps.org/abstract/PRL/v102/e256103

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abstract = "A quantitative comparison between experiment and theory is presented, which shows that all ions of the Suzuki structure on (001) surfaces of Mg2+ or Cd2+ doped NaCl crystals can be identified despite the tip-surface distance, differences in impurity chemistry, and surface termination. The identification can be used to calibrate the potential of the tip{\textquoteright}s last atom, and it is proposed to use these surfaces for better characterization of deposited nano-objects.",

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AB - A quantitative comparison between experiment and theory is presented, which shows that all ions of the Suzuki structure on (001) surfaces of Mg2+ or Cd2+ doped NaCl crystals can be identified despite the tip-surface distance, differences in impurity chemistry, and surface termination. The identification can be used to calibrate the potential of the tip’s last atom, and it is proposed to use these surfaces for better characterization of deposited nano-objects.

KW - AFM

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