Chemical Identification of Ions in Doped NaCl by Scanning Force Microscopy

Adam S. Foster, Clemens Barth, Claude R. Henry

Research output: Contribution to journalArticleScientificpeer-review

20 Citations (Scopus)
9 Downloads (Pure)

Abstract

A quantitative comparison between experiment and theory is presented, which shows that all ions of the Suzuki structure on (001) surfaces of Mg2+ or Cd2+ doped NaCl crystals can be identified despite the tip-surface distance, differences in impurity chemistry, and surface termination. The identification can be used to calibrate the potential of the tip’s last atom, and it is proposed to use these surfaces for better characterization of deposited nano-objects.
Original languageEnglish
Article number256103
Pages (from-to)1-4
Number of pages4
JournalPhysical Review Letters
Volume102
Issue number25
DOIs
Publication statusPublished - 2009
MoE publication typeA1 Journal article-refereed

Keywords

  • AFM

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