Charged point defects in semiconductors and the supercell approximation

J. Lento, J.-L. Mozos, R.M. Nieminen

Research output: Contribution to journalArticleScientificpeer-review

100 Citations (Scopus)
Original languageEnglish
Pages (from-to)2637-2645
JournalJournal of physics: Condensed matter
Volume14
Publication statusPublished - 2002
MoE publication typeA1 Journal article-refereed

Keywords

  • point defect
  • semiconductor
  • supercell

Cite this