Charge collection measurements of CdTe detectors using IBIC imaging method

Matti Kalliokoski, Erik Brücken, Maria Golovleva, Akiko Gädda, Jaakko Härkönen, Aneliya Karadzhinova-Ferrer, Vladyslav Litichevskyi, Panja Luukka, Jennifer Ott

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Abstract

Ion beam induced current (IBIC) analysis allows to study the effects of various materials selection to the detector performance. We analysed Cadmium Telluride (CdTe) pad detectors which were passivated either by using aluminium nitride (AlN) or by aluminium oxide (Al2O3). By using microbeam with 2 MeV protons, we were able to measure various surface effects, the charge collection efficiency, and analyse the impact of surface defects which could reduce the detector performance in applications such as medical imaging. The detectors we measured had surface area of 1 cm × 1 cm, and thickness of 1 mm. Various bias settings were applied to allow detailed charge collection studies. In this paper we show some selected results of the IBIC measurements.

Original languageEnglish
Title of host publication2018 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2018 - Proceedings
PublisherIEEE
ISBN (Electronic)9781538684948
DOIs
Publication statusPublished - 1 Nov 2018
MoE publication typeA4 Article in a conference publication
EventIEEE Nuclear Science Symposium and Medical Imaging Conference - Sydney, Australia
Duration: 10 Nov 201817 Nov 2018

Conference

ConferenceIEEE Nuclear Science Symposium and Medical Imaging Conference
Abbreviated titleNSS/MIC
CountryAustralia
CitySydney
Period10/11/201817/11/2018

Keywords

  • CdTe
  • defects
  • IBIC

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