Characterization of TlBr for X-ray and γ-ray detector applications

Research output: Contribution to journalArticleScientificpeer-review

Researchers

  • P. Kostamo
  • M. Shorohov
  • V. Gostilo
  • H. Sipilä
  • V. Kozlov
  • I. Lisitsky
  • M. Kuznetsov
  • A. Lankinen
  • A. N. Danilewsky
  • Harri Lipsanen

  • M. Leskelä

Research units

  • Bruker Baltic
  • Oxford Instruments Analytical Oy
  • University of Helsinki
  • Institute of Rare Metals
  • University of Freiburg

Abstract

Crystal quality of radiation detector-grade TlBr material was analyzed by X-ray diffraction and synchrotron X-ray topography methods. The analyzed TlBr crystals were further processed for electrical characterization and current-voltage characteristics were measured at a temperature range of 210-320 K. The crystals studied in this work were grown by the Bridgman-Stockbarger process. X-ray diffraction measurements show the presence of small-angle grain boundaries in the crystals. The crystal with the most pronounced small-angle boundaries showed the lowest resistivity and the poorest spectroscopic characteristics.

Details

Original languageEnglish
Pages (from-to)129-131
Number of pages3
JournalNUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION A: ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
Volume607
Issue number1
Publication statusPublished - 1 Aug 2009
MoE publication typeA1 Journal article-refereed

    Research areas

  • γ-ray detector, TlBr, X-ray detector, X-ray topography

ID: 5564742