Crystal quality of radiation detector-grade TlBr material was analyzed by X-ray diffraction and synchrotron X-ray topography methods. The analyzed TlBr crystals were further processed for electrical characterization and current-voltage characteristics were measured at a temperature range of 210-320 K. The crystals studied in this work were grown by the Bridgman-Stockbarger process. X-ray diffraction measurements show the presence of small-angle grain boundaries in the crystals. The crystal with the most pronounced small-angle boundaries showed the lowest resistivity and the poorest spectroscopic characteristics.
|Number of pages||3|
|Journal||NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION A: ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT|
|Publication status||Published - 1 Aug 2009|
|MoE publication type||A1 Journal article-refereed|
- γ-ray detector
- X-ray detector
- X-ray topography