Characterization of TlBr for X-ray and γ-ray detector applications

P. Kostamo*, M. Shorohov, V. Gostilo, H. Sipilä, V. Kozlov, I. Lisitsky, M. Kuznetsov, A. Lankinen, A. N. Danilewsky, H. Lipsanen, M. Leskelä

*Corresponding author for this work

    Research output: Contribution to journalArticleScientificpeer-review

    6 Citations (Scopus)

    Abstract

    Crystal quality of radiation detector-grade TlBr material was analyzed by X-ray diffraction and synchrotron X-ray topography methods. The analyzed TlBr crystals were further processed for electrical characterization and current-voltage characteristics were measured at a temperature range of 210-320 K. The crystals studied in this work were grown by the Bridgman-Stockbarger process. X-ray diffraction measurements show the presence of small-angle grain boundaries in the crystals. The crystal with the most pronounced small-angle boundaries showed the lowest resistivity and the poorest spectroscopic characteristics.

    Original languageEnglish
    Pages (from-to)129-131
    Number of pages3
    JournalNUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION A: ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
    Volume607
    Issue number1
    DOIs
    Publication statusPublished - 1 Aug 2009
    MoE publication typeA1 Journal article-refereed

    Keywords

    • γ-ray detector
    • TlBr
    • X-ray detector
    • X-ray topography

    Fingerprint Dive into the research topics of 'Characterization of TlBr for X-ray and γ-ray detector applications'. Together they form a unique fingerprint.

  • Cite this