Characterization of thin films based on reflectance and transmittance measurements at oblique angles of incidence

Saulius Nevas, Antti Lamminpää, Farshid Manoocheri, Erkki Ikonen

Research output: Working paperProfessional

20 Citations (Scopus)
Original languageEnglish
Publication statusPublished - 2004
MoE publication typeD4 Published development or research report or study

Publication series

NameNinth Topical Meeting on Optical Interference Coatings (OIC 2004), Loews Ventana Canyon Resort & Spa, Tucson, Arizona, June 27 - July 2, 2004, WB10

Keywords

  • characterization
  • oblique incidence
  • polarization
  • reflectance
  • refractive index
  • thin film
  • transmittance

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