Characterization of PillarHall test chip structures using a reflectometry technique

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• Finished

  ATMOC (EMPIR): Traceable metrology of soft-X-ray to IR optical constants and nanofilms for advanced manufacturing

  Manoocheri, F. (Principal investigator), Rastgou, M. (Project Member), Danilenko, A. (Project Member) & Peltoniemi, J. (Project Member)

  01/07/2021 → 30/06/2024

  Project: EU Other competitive funding

  • Reflectance Spectrum 100%
  • Refractivity 50%
  • Refractive Index 50%
  • Layer Thickness 50%
  • Silicon Wafer 50%

• PREIN: Photonics Research and Innovation

  Mäkelä, K. (Principal investigator)

  01/01/2019 → 31/12/2022

  Project: Academy of Finland: Other research funding

  • Silicon 100%
  • Nanowires 75%
  • Heterojunction 73%
  • Surface (Surface Science) 73%
  • Thin Films 69%