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Characterization of PillarHall test chip structures using a reflectometry technique
Aleksandr Danilenko*, Masoud Rastgou, Farshid Manoocheri, Jussi Kinnunen, Virpi Korpelainen, Antti Lassila, Erkki Ikonen
*Corresponding author for this work
Research output: Contribution to journal › Article › Scientific › peer-review
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