Characterization of iron oxide thin films

M. Aronniemi, J. Lahtinen, P. Hautojärvi

Research output: Contribution to journalArticleScientificpeer-review

102 Citations (Scopus)
Original languageEnglish
Pages (from-to)1004-1006
JournalSurface and Interface Analysis
Volume36
Issue number8
Publication statusPublished - 2004
MoE publication typeA1 Journal article-refereed

Keywords

  • AFM
  • iron oxide
  • thin film
  • XPS
  • XRD

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