Characterization of InGaN/GaN and AlGaN/GaN superlattices by X-ray diffraction and X-ray reflectivity measurements

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Original languageEnglish
Pages (from-to)1790-1793
Number of pages4
JournalPHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS
Volume7
Issue number7-8
Publication statusPublished - Jul 2010
MoE publication typeA1 Journal article-refereed

    Research areas

  • III-V nitides, simulation, superlattices, X-ray refletivity, X-ray scattering

ID: 5565041