Characterization of InGaN/GaN and AlGaN/GaN superlattices by X-ray diffraction and X-ray reflectivity measurements

Sakari Sintonen, Sami Suihkonen, Olli Svensk, Pekka Tuomas Törmä, Muhammad Ali, Markku Sopanen, Harri Lipsanen

Research output: Contribution to journalArticleScientificpeer-review

5 Citations (Scopus)
Original languageEnglish
Pages (from-to)1790-1793
Number of pages4
JournalPHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS
Volume7
Issue number7-8
DOIs
Publication statusPublished - Jul 2010
MoE publication typeA1 Journal article-refereed

Keywords

  • III-V nitides
  • simulation
  • superlattices
  • X-ray refletivity
  • X-ray scattering

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