Skip to main navigation Skip to search Skip to main content

Characterization of Heavily Irradiated Dielectrics for Pixel Sensors Coupling Insulator Applications

  • S. Bharthuar*
  • , M. Golovleva
  • , M. Bezak
  • , E. Brücken
  • , A. Gädda
  • , J. Härkönen
  • , A. Karadzhinova-Ferrer
  • , N. Kramarenko
  • , S. Kirschenmann
  • , Pirkitta Koponen
  • , P. Luukka
  • , K. Mizohata
  • , J. Ott
  • , E. Tuominen
  • *Corresponding author for this work
  • Helsinki Institute of Physics
  • University of Helsinki
  • LUT University
  • Okmetic Oy
  • Ludong University

Research output: Contribution to journalArticleScientificpeer-review

1 Citation (Scopus)
85 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Characterization of Heavily Irradiated Dielectrics for Pixel Sensors Coupling Insulator Applications'. Together they form a unique fingerprint.
Sort by

INIS

Engineering

Physics

Material Science

Keyphrases