Characterization of doped strontium sulfide thin films by secondary ion mass spectrometry, Rutherford backscattering spectrometry and x-ray fluorescence spectrometry

S. Lehto, P. Soininen, L. Niinistö, J. Likonen, R. Lappalainen

    Research output: Contribution to journalArticleScientificpeer-review

    6 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)1725-1729
    JournalAnalyst
    Volume119
    Publication statusPublished - 1994
    MoE publication typeA1 Journal article-refereed

    Keywords

    • RBS
    • SIMS
    • strontium sulfide
    • thin films
    • X-ray fluorescence

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