Characterization of doped strontium sulfide thin films by secondary ion mass spectrometry, Rutherford backscattering spectrometry and x-ray fluorescence spectrometry

S. Lehto; P. Soininen; L. Niinistö; J. Likonen; R. Lappalainen

Characterization of doped strontium sulfide thin films by secondary ion mass spectrometry, Rutherford backscattering spectrometry and x-ray fluorescence spectrometry

S. Lehto, P. Soininen, L. Niinistö, J. Likonen, R. Lappalainen

Research output: Contribution to journal › Article › Scientific › peer-review

6 Citations (Scopus)

Original language	English
Pages (from-to)	1725-1729
Journal	Analyst
Volume	119
Publication status	Published - 1994
MoE publication type	A1 Journal article-refereed

Keywords

RBS
SIMS
strontium sulfide
thin films
X-ray fluorescence

Cite this

@article{6189f9fa1d9d45a2befc3531a75fbf11,

title = "Characterization of doped strontium sulfide thin films by secondary ion mass spectrometry, Rutherford backscattering spectrometry and x-ray fluorescence spectrometry",

keywords = "RBS, SIMS, strontium sulfide, thin films, X-ray fluorescence, RBS, SIMS, strontium sulfide, thin films, X-ray fluorescence, RBS, SIMS, strontium sulfide, thin films, X-ray fluorescence",

author = "S. Lehto and P. Soininen and L. Niinist{\"o} and J. Likonen and R. Lappalainen",

year = "1994",

language = "English",

volume = "119",

pages = "1725--1729",

journal = "Analyst",

issn = "0003-2654",

}

TY - JOUR

T1 - Characterization of doped strontium sulfide thin films by secondary ion mass spectrometry, Rutherford backscattering spectrometry and x-ray fluorescence spectrometry

AU - Lehto, S.

AU - Soininen, P.

AU - Niinistö, L.

AU - Likonen, J.

AU - Lappalainen, R.

PY - 1994

Y1 - 1994

KW - RBS

KW - SIMS

KW - strontium sulfide

KW - thin films

KW - X-ray fluorescence

KW - RBS

KW - SIMS

KW - strontium sulfide

KW - thin films

KW - X-ray fluorescence

KW - RBS

KW - SIMS

KW - strontium sulfide

KW - thin films

KW - X-ray fluorescence

M3 - Article

VL - 119

SP - 1725

EP - 1729

JO - Analyst

JF - Analyst

SN - 0003-2654

ER -