Characterization of Deep Levels in P-type Silicon by DLTS

A. Malinin

Research output: Working paperProfessional

Original languageEnglish
Place of PublicationEspoo
Publication statusPublished - 1997
MoE publication typeD4 Published development or research report or study

Publication series

NameReports in Electron Physics
PublisherElektronifysiikan laboratorio
No.1997/12

Keywords

  • deep levels
  • DLTS
  • silicon

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